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Array nonuniformity correction: new procedures designed for difficult measurement conditions

著者名:
Sieglinger, B.A. ( Consultant for MacAulay-Brown, Inc. (USA) )
Norman, J.D. ( Air Force Research Lab. (USA) )
Meshell, W.M. ( MacAulay-Brown, Inc. (USA) )
Flynn, D.S. ( Consultant for MacAulay-Brown, Inc. (USA) )
Thompson, R.A. ( Air Force Research Lab. (USA) )
Goldsmith, G.C., II
さらに 1 件
掲載資料名:
Technologies for synthetic environments: Hardware-in-the-loop testing VIII : 21-22 April 2003, Oriando, Florida, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5092
発行年:
2003
開始ページ:
210
終了ページ:
220
総ページ数:
11
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449528 [0819449520]
言語:
英語
請求記号:
P63600/5092
資料種別:
国際会議録

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