Array nonuniformity correction: new procedures designed for difficult measurement conditions
- 著者名:
Sieglinger, B.A. ( Consultant for MacAulay-Brown, Inc. (USA) ) Norman, J.D. ( Air Force Research Lab. (USA) ) Meshell, W.M. ( MacAulay-Brown, Inc. (USA) ) Flynn, D.S. ( Consultant for MacAulay-Brown, Inc. (USA) ) Thompson, R.A. ( Air Force Research Lab. (USA) ) Goldsmith, G.C., II - 掲載資料名:
- Technologies for synthetic environments: Hardware-in-the-loop testing VIII : 21-22 April 2003, Oriando, Florida, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5092
- 発行年:
- 2003
- 開始ページ:
- 210
- 終了ページ:
- 220
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449528 [0819449520]
- 言語:
- 英語
- 請求記号:
- P63600/5092
- 資料種別:
- 国際会議録
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