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Raman and scanning electron microscopy measurements of RDX on glass substrates

著者名:
Torres, P. ( Univ. of Puerto Rico at Mayaguez (USA) )
Mercado, L.
Mortimer, L.
Mina, N.
Hernandez-Rivera, S.P.
Lareau, R.T. ( Transportation Security Administration (USA) )
Chamberlain, R.T.
Castro, M.E. ( Univ. of Puerto Rico at Mayaguez (USA) )
さらに 3 件
掲載資料名:
Detection and Remediation Technologies for Mines and Minelike Targets VIII
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5089
発行年:
2003
巻:
2
パート:
Session 25
開始ページ:
1054
終了ページ:
1064
総ページ数:
11
出版情報:
Bellingham, WA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449498 [0819449490]
言語:
英語
請求記号:
P63600/5089
資料種別:
国際会議録

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