Test method for multiband imaging sensors
- 著者名:
- Bijl, P. ( TNO (Netherlands) )
- Hogervorst, M.A. ( TNO (Netherlands) )
- 掲載資料名:
- Infrared imaging systems: design, analysis, modeling, and testing XIV : 23-24 April 2003, Oriando, Florida, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5076
- 発行年:
- 2003
- 開始ページ:
- 208
- 終了ページ:
- 219
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819449351 [0819449350]
- 言語:
- 英語
- 請求記号:
- P63600/5076
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Identification of military targets and simple laboratory test patterns in band-limited noise
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
10
国際会議録
Human search with a limited field of view: the effect of scanning parameters and scene content
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |