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Development of Si:As impurity band conduction (IBC) detectors for mid-infrared applications

著者名:
Ando, K.J. ( Raytheon Vision Systems (USA) )
Hoffman, A.W. ( Raytheon Vision Systems (USA) )
Love, P.J. ( Raytheon Vision Systems (USA) )
Toth, A. ( Raytheon Vision Systems (USA) )
Anderson, C. ( Raytheon Vision Systems (USA) )
Chapman, G. ( Raytheon Vision Systems (USA) )
McCreight, C.R. ( NASA Ames Research Ctr. (USA) )
Ennico, K.A. ( NASA Ames Research Ctr. (USA) )
McKelvey, M.E. ( NASA Ames Research Ctr. (USA) )
McMurray, R.E. Jr., ( NASA Ames Research Ctr. (USA) )
さらに 5 件
掲載資料名:
Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5074
発行年:
2003
開始ページ:
648
終了ページ:
657
総ページ数:
10
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819449337 [0819449334]
言語:
英語
請求記号:
P63600/5074
資料種別:
国際会議録

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