Trace elemental analysis of glass and paint samples of forensic interest by ICP-MS using laser ablation solid sample introduction

Trace elemental analysis of glass and paint samples of forensic interest by ICP-MS using laser ablation solid sample introduction

著者名:

Almirall, J.R. ( International Forensic Research Institute (USA) )
Trejos, T. ( International Forensic Research Institute (USA) )
Hobbs, A. ( International Forensic Research Institute (USA) )
Furton, K.G. ( International Forensic Research Institute (USA) )

掲載資料名:

Sensors, and command, control, communications, and intelligence (C31) technologies for homeland defense and law enforcement II : 21-25 April 2003, Orlando, Florida, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5071

発行年:

2003

開始ページ:

193

終了ページ:

204

総ページ数:

12

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819449306 [081944930X]

言語:

英語

請求記号:

P63600/5071

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013059
シリーズID:	PA00000029
会議名:	Defense, Security, and Sensing : Sensors, and Command, Control, Communications, and Intelligence (C31) Technologies for Homeland Defense and Law Enforcement
回次:	2003 : 2nd
会議開催地:	Oriando, FL, USA
会議開催年:	2003.04.21-2003.04.25

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