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Moire interferometry and hole drilling system for residual stress measurement

著者名:
  • Ya, M. ( Tsinghua Univ. (China) )
  • Dai, F. ( Tsinghua Univ. (China) )
  • Lu, J. ( Univ. de Technologie de Troyes (France) )
掲載資料名:
Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5058
発行年:
2003
開始ページ:
400
終了ページ:
406
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448644 [0819448648]
言語:
英語
請求記号:
P63600/5058
資料種別:
国際会議録

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