Automated management for pavement inspection system (AMPIS)
- 著者名:
- Chung, H.C. ( Univ. of California, Irvine (USA) )
- Girardello, R. ( Univ. degli Studi di Padova (Italy) )
- Soeller, T. ( Univ. of California, Irvine (USA) )
- Shinozuka, M. ( Univ. of California, Irvine (USA) )
- 掲載資料名:
- Smart structures and materials 2003 : Smart systems and nondestructive evaluation for civil infrastructures : 3-6 March 2003, San Diego, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5057
- 発行年:
- 2003
- 開始ページ:
- 634
- 終了ページ:
- 644
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448620 [0819448621]
- 言語:
- 英語
- 請求記号:
- P63600/5057
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society for Optical Engineering |
Springer-Verlag |
SPIE-The International Society for Optical Engineering |
10
国際会議録
Automated visual inspection stations for next-generation semiconductor package quality control
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |