Application of probabilistic neural network and static test data to the classification of bridge damage patterns

Application of probabilistic neural network and static test data to the classification of bridge damage patterns

著者名:

Yan, B. ( Yamaguchi Univ. (Japan) )
Miyamoto, A. ( Yamaguchi Univ. (Japan) )

掲載資料名:

Smart structures and materials 2003 : Smart systems and nondestructive evaluation for civil infrastructures : 3-6 March 2003, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5057

発行年:

2003

開始ページ:

606

終了ページ:

617

総ページ数:

12

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448620 [0819448621]

言語:

英語

請求記号:

P63600/5057

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013048
シリーズID:	PA00000029
会議名:	Smart Structures and Materials
回次:	2003
会議開催地:	San Diego, CA, USA
会議開催年:	2003.03.03-2003.03.06

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