Experiments in ultrasonic flaw detection using a MEMS transducer

Experiments in ultrasonic flaw detection using a MEMS transducer

著者名:

Jain, A. ( Carnegie Mellon Univ. (USA) )
Greve, D.W. ( Carnegie Mellon Univ. (USA) )
Oppenheim, I.J. ( Carnegie Mellon Univ. (USA) )

掲載資料名:

Smart structures and materials 2003 : Smart systems and nondestructive evaluation for civil infrastructures : 3-6 March 2003, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5057

発行年:

2003

開始ページ:

431

終了ページ:

439

総ページ数:

9

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448620 [0819448621]

言語:

英語

請求記号:

P63600/5057

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013048
シリーズID:	PA00000029
会議名:	Smart Structures and Materials
回次:	2003
会議開催地:	San Diego, CA, USA
会議開催年:	2003.03.03-2003.03.06

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