Damage estimation method using committee of neural networks

Damage estimation method using committee of neural networks

著者名:

Yun, C.B. ( Korea Advanced Institute of Science and Technology (South Korea) )
Lee, J.W. ( Korea Institute of Machinery and Materials (South Korea) )
Kim, J.D. ( Korea Institute of Machinery and Materials (South Korea) )
Min, K.W. ( Dankook Univ. (South Korea) )

掲載資料名:

Smart Nondestructive Evaluation and Health Monitoring of Structural and Biological Systems II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5047

発行年:

2003

開始ページ:

263

終了ページ:

274

総ページ数:

12

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448521 [0819448524]

言語:

英語

請求記号:

P63600/5047

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013038
シリーズID:	PA00000029
会議名:	Smart Structures : Smart Nondestructive Evaluation and Health Monitoring of Structural and Biological Systems
回次:	2003 : 2nd
会議開催地:	San Diego, CA, USA
会議開催年:	2003.03.03-2003.03.05

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