Acoustic microscopy: a powerful tool to inspect microstructures of electronic devices (Invited Paper)
- 著者名:
- Fassbender, S.U. ( Institute for Acoustic Microscopy (Germany) )
- Kraemer, K. ( Institute for Acoustic Microscopy (Germany) )
- 掲載資料名:
- Testing, Reliability, and Application of Micro- and Nano-Material Systems
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5045
- 発行年:
- 2003
- 開始ページ:
- 112
- 終了ページ:
- 121
- 総ページ数:
- 10
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448507 [0819448508]
- 言語:
- 英語
- 請求記号:
- P63600/5045
- 資料種別:
- 国際会議録
類似資料:
MRS - Materials Research Society |
SPIE - The International Society of Optical Engineering |
Trans Tech Publications |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
6
国際会議録
Integrated tool for fabrication of electronic components by laser direct write (Invited Paper)
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |