Microscopic NDE of hidden corrosion

Microscopic NDE of hidden corrosion

著者名:

Blackshire, J.L. ( Air Force Research Lab. (USA) )
Hoffmann, J. ( Univ. of Dayton Research Institute (USA) )
Kropas-Hughes, C.V. ( Air Force Research Lab. (USA) )
Tansel, I. ( Florida International Univ. (USA) )

掲載資料名:

Testing, Reliability, and Application of Micro- and Nano-Material Systems

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5045

発行年:

2003

開始ページ:

93

終了ページ:

103

総ページ数:

11

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448507 [0819448508]

言語:

英語

請求記号:

P63600/5045

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013036
シリーズID:	PA00000029
会議名:	Smart Structures : Testing, Reliability, and Application of Micro-and Nano-Material Systems
回次:	2003
会議開催地:	San Diego, CA, USA
会議開催年:	2003.03.03-2003.03.05

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