Investigation of product design weaknesses using model-based OPC sensitivity analysis
- 著者名:
Postnikov, S.V. ( Motorola, Inc. (USA) ) Lucas, K. ( Motorola, Inc. (USA) ) Garza, C.M. ( Motorola, Inc. (USA) ) Wimmer, K. ( Motorola, Inc. (France) ) LaCour, P. ( Mentor Graphics Corp. (USA) ) Word, J.C. ( Integrated Device Technology, Inc. (USA) ) - 掲載資料名:
- Design and process integration for microelectronic manufacturing II : 26-28 February 2003, Santa Clara, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5042
- 発行年:
- 2003
- 開始ページ:
- 160
- 終了ページ:
- 171
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448477 [0819448478]
- 言語:
- 英語
- 請求記号:
- P63600/5042
- 資料種別:
- 国際会議録
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