Measurement of the dielectric function spectra of low dielectric constant using the spectroscopic ellipsometry
- 著者名:
Horie, M. ( Dainippon Screen Manufacturing Co., Ltd. (Japan) ) Postava, K. ( Technical Univ. of Ostrava (Czech Republic) ) Yamaguchi, T. ( Shizuoka Univ. (Japan) ) Akashika, K. ( Dainippon Screen Manufacturing Co., Ltd. (Japan) ) Hayashi, H. ( Dainippon Screen Manufacturing Co., Ltd. (Japan) ) Kitamura, F. ( Dainippon Screen Manufacturing Co., Ltd. (Japan) ) - 掲載資料名:
- Metrology, Inspection, and Process Control for Microlithography XVII
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5038
- 発行年:
- 2003
- 巻:
- 2
- 開始ページ:
- 803
- 終了ページ:
- 809
- 総ページ数:
- 7
- 出版情報:
- Bellingham, WA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448439 [0819448435]
- 言語:
- 英語
- 請求記号:
- P63600/5038
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
MRS-Materials Research Society |
MRS - Materials Research Society |