CD control at low K1 optical lithography in DRAM device
- 著者名:
Hong, J. ( Hynix Semiconductor Inc. (South Korea) ) Woo, C. ( Hynix Semiconductor Inc. (South Korea) ) Park, J. ( Hynix Semiconductor Inc. (South Korea) ) Cho, B. ( Hynix Semiconductor Inc. (South Korea) ) Choi, J.-S. ( Hynix Semiconductor Inc. (South Korea) ) Yang, H. ( Hynix Semiconductor Inc. (South Korea) ) Park, C. ( Hynix Semiconductor Inc. (South Korea) ) Shin, Y.-C. ( Hynix Semiconductor Inc. (South Korea) ) Kim, Y. ( Hynix Semiconductor Inc. (South Korea) ) Jeong, G. ( Hynix Semiconductor Inc. (South Korea) ) Kim, J. ( Hynix Semiconductor Inc. (South Korea) ) Kang, K. ( Hynix Semiconductor Inc. (South Korea) ) Kang, C. ( Hynix Semiconductor Inc. (South Korea) ) Yim, D. ( Hynix Semiconductor Inc. (South Korea) ) Song, Y. ( Hynix Semiconductor Inc. (South Korea) ) - 掲載資料名:
- Metrology, Inspection, and Process Control for Microlithography XVII
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 5038
- 発行年:
- 2003
- 巻:
- 1
- 開始ページ:
- 406
- 終了ページ:
- 414
- 総ページ数:
- 9
- 出版情報:
- Bellingham, WA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819448439 [0819448435]
- 言語:
- 英語
- 請求記号:
- P63600/5038
- 資料種別:
- 国際会議録
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