Nondestructive diagnostics of bulk GaAs and CdZnTe crystals by nanosecond and picosecond wave-mixing techniques

Nondestructive diagnostics of bulk GaAs and CdZnTe crystals by nanosecond and picosecond wave-mixing techniques

著者名:

Sudzius, M. ( Vilnius Univ. (Lithuania) )

Gudelis, V. ( Vilnius Univ. (Lithuania) )

Aleksiejunas, R. ( Vilnius Univ. (Lithuania) )

Storasta, J. ( Vilnius Univ. (Lithuania) )

Jarasiunas, K. ( Vilnius Univ. (Lithuania) )

Cola, A. ( Istituto per lo Studio di nuovi Materiali per l'Elettronica (Italy) )

さらに 1 件

掲載資料名:

Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

5024

発行年:

2003

開始ページ:

145

終了ページ:

156

総ページ数:

12

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819448255 [0819448257]

言語:

英語

請求記号:

P63600/5024

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013008
シリーズID:	PA00000029
会議名:	Optics and Photonics

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