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Electromagnetic wave reflection by rough fractal surface of semiconductor materials

著者名:
掲載資料名:
Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5024
発行年:
2003
開始ページ:
90
終了ページ:
97
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448255 [0819448257]
言語:
英語
請求記号:
P63600/5024
資料種別:
国際会議録

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