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Improved Vector Error Diffusion for Reduction of Smear Artifact in the Boundary Regions

著者名:
  • Lee, S.-C. ( Kyungpook National Univ. (South Korea) )
  • Kim, Y.-T. ( Kyungpook National Univ. (South Korea) )
  • Cho, Y.-H. ( Kyungpook National Univ. (South Korea) )
  • Ha, Y.-H. ( Kyungpook National Univ. (South Korea) )
掲載資料名:
Color imaging VIII : processing, hardcopy, and applications : 21-24 January 2003, Santa Clara, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
5008
発行年:
2003
開始ページ:
467
終了ページ:
474
総ページ数:
8
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819448088 [0819448087]
言語:
英語
請求記号:
P63600/5008
資料種別:
国際会議録

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