Diffraction efficiency simulation for large off-axis HOEs

Diffraction efficiency simulation for large off-axis HOEs

著者名:: Tomono, T. ( Samsung Electronics Co., Ltd. (South Korea) )
掲載資料名:: Practical Holography XVII and Holographic Materials IX
シリーズ名:: Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:: 5005
発行年:: 2003
開始ページ:: 414
終了ページ:: 421
総ページ数:: 8
出版情報:: Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819448057 [0819448052]
言語:: 英語
請求記号:: P63600/5005
資料種別:: 国際会議録

詳細

TDL書誌ID:	ZA00012988
シリーズID:	PA00000029
会議名:	IS&T/SPIE Electronic Imaging : Practical Holography ; Holographic Materials
回次:	2003 : 17th ; 9th
会議開催地:	Santa Clara, CA, USA
会議開催年:	2003.0121-2003.0123

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