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Reliability and failure mechanisms of oxide VCSELs in non-hermetic enviroments

著者名:
Xie, S. ( Agilent Technologies, Inc. (USA) )
Herrick, R.W. ( Agilent Technologies, Inc. (USA) )
Brabander, G.N.D. ( Agilent Technologies, Inc. (USA) )
Widjaja, W.H. ( Agilent Technologies, Inc. (USA) )
Koelle, U. ( Agilent Technologies, Inc. (USA) )
Cheng, A.-N. ( Agilent Technologies, Inc. (USA) )
Giovane, L.M. ( Agilent Technologies, Inc. (USA) )
Hu, F.Z. ( Agilent Technologies, Inc. (USA) )
Keever, M.R. ( Agilent Technologies, Inc. (USA) )
Osentowski, T. ( Agilent Technologies, Inc. (USA) )
McHugo, S.A. ( Agilent Technologies, Inc. (USA) )
Mayonte, M.S. ( Agilent Technologies, Inc. (USA) )
Kim, S.M. ( Agilent Technologies, Inc. (USA) )
Chamberlin, D.R. ( Agilent Technologies, Inc. (USA) )
Rosner, S.J. ( Agilent Technologies, Inc. (USA) )
Girolami, G. ( Agilent Technologies, Inc. (USA) )
さらに 11 件
掲載資料名:
Vertical-Cavity Surface-Emitting Lasers VII
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4994
発行年:
2003
開始ページ:
173
終了ページ:
180
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447944 [0819447943]
言語:
英語
請求記号:
P63600/4994
資料種別:
国際会議録

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