Studies of ESD-related failure patterns of Agilent oxide VCSELs

Studies of ESD-related failure patterns of Agilent oxide VCSELs

著者名:

Krueger, J.J. ( Agilent Technologies (USA) )

Sabharwal, R. ( Agilent Technologies (USA) )

McHugo, S.A. ( Agilent Technologies (USA) )

Nguyen, K. ( Agilent Technologies (USA) )

Tan, N.-X. ( Agilent Technologies (USA) )

Janda, N. ( Agilent Technologies (USA) )

Mayonte, M.S. ( Agilent Technologies (USA) )

Heidecker, M. ( Agilent Technologies (USA) )

Eastley, D. ( Agilent Technologies (USA) )

Keever, M.R. ( Agilent Technologies (USA) )

Kocot, C.P. ( Agilent Technologies (USA) )

さらに 6 件

掲載資料名:

Vertical-Cavity Surface-Emitting Lasers VII

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4994

発行年:

2003

開始ページ:

162

終了ページ:

172

総ページ数:

11

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447944 [0819447943]

言語:

英語

請求記号:

P63600/4994

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012977
シリーズID:	PA00000029
会議名:	Photonics West - Optoelectronic Materials and Devices : Vertical-cavity surface-emitting lasers
回次:	2003 : 7th
会議開催地:	San Jose, CA, USA
会議開催年:	2003.01.29-2003.01.30

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