Analysis of heat flows and their impact on the reliability of high-power diode lasers
- 著者名:
Tomm, J.W. ( Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany) ) Rinner, F. ( Fraunhofer-Institut fuer Angewandte Festkyrperphysik (Germany) ) Rogg, J. ( Fraunhofer-Institut fuer Angewandte Festkyrperphysik (Germany) ) Thamm, E. ( Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany) ) Ribbat, C. ( Technische Univ. Berlin (Germany) ) Sellin, R. ( Technische Univ. Berlin (Germany) ) Bimberg, D. ( Technische Univ. Berlin (Germany) ) - 掲載資料名:
- High-Power Fiber and Semiconductor Lasers
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4993
- 発行年:
- 2003
- 開始ページ:
- 91
- 終了ページ:
- 98
- 総ページ数:
- 8
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447937 [0819447935]
- 言語:
- 英語
- 請求記号:
- P63600/4993
- 資料種別:
- 国際会議録
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6
国際会議録
Direct spectroscopic measurement of packaging-induced strains in high-power laser diode arrays
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |