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Optical measurement of asymmetric structures: monitoring of organically doped film properties during Corona poling (Invited Paper)

著者名:
掲載資料名:
Integrated Optics: Devices, Materials, and Technologies VII
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4987
発行年:
2003
開始ページ:
1
終了ページ:
12
総ページ数:
12
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447876 [0819447870]
言語:
英語
請求記号:
P63600/4987
資料種別:
国際会議録

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