Degradation of monolayer lubricants for MEMS
- 著者名:
- Dugger, M.T. ( Sandia National Labs. (USA) )
- Hohlfelder, R.J. ( Sandia National Labs. (USA) )
- Peebles, D.E. ( Sandia National Labs. (USA) )
- 掲載資料名:
- Reliability, Testing, and Characterization of MEMS/MOEMS II
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4980
- 発行年:
- 2003
- 開始ページ:
- 138
- 終了ページ:
- 150
- 総ページ数:
- 13
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447807 [0819447803]
- 言語:
- 英語
- 請求記号:
- P63600/4980
- 資料種別:
- 国際会議録
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