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Quantitative phase measurements using a quadrature tomographic microscope

著者名:
Townsend, D.J. ( Northeastern Univ. (USA) )
Quarles, K.D. ( Morehouse College (USA) )
Thomas, A.L. ( Morehouse College (USA) )
Rockward, W.S. ( Morehouse College (USA) )
Warner, C.M. ( Northeastern Univ. (USA) )
Newmark, J.A. ( Northeastern Univ. (USA) )
DiMarzio, C.A. ( Northeastern Univ. (USA) )
さらに 2 件
掲載資料名:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing X
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4964
発行年:
2003
開始ページ:
59
終了ページ:
65
総ページ数:
7
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
16057422
ISBN:
9780819447647 [0819447641]
言語:
英語
請求記号:
P63600/4964
資料種別:
国際会議録

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