Fabrication by rf-sputtering processing of Er3 + /Yb3 + -codoped silica-titania planar waveguides
- 著者名:
Chiasera, A. ( INFM at Univ. degli Studi di Trento (Italy) ) Montagna, M. ( INFM at Univ. degli Studi di Trento (Italy) ) Tosello, C. ( INFM at Univ. degli Studi di Trento (Italy) ) Goncalves, R.R. ( INFM at Univ. degli Studi di Trento (Italy) ) Zampedri, L. ( IFN-CNR (Italy) ) Ferrari, M. ( IFN-CNR (Italy) ) Brenci, M. ( IFAC-CNR (Italy) ) Pelli, S. ( IFAC-CNR (Italy) ) Righini, G.C. ( IFAC-CNR (Italy) ) Bersani, M. ( IRST (Italy) ) Lazzeri, P. ( IRST (Italy) ) Casa, P.D. ( Agilent Technologies Italia S.p.A. (Italy) ) - 掲載資料名:
- Integrated Optical Devices: Fabrication and Testing
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4944
- 発行年:
- 2003
- 開始ページ:
- 53
- 終了ページ:
- 61
- 総ページ数:
- 9
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447395 [0819447390]
- 言語:
- 英語
- 請求記号:
- P63600/4944
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
2
国際会議録
Erbium/Ytterbium-activated silica-titania planar and channel waveguides prepared by rf-sputtering
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |