Characterization of TiNi, TiNiPd thin films by ion beam analysis techniques
- 著者名:
- Mathe, V.K. ( RMIT Univ. (Australia) )
- Sood, D.K. ( RMIT Univ. (Australia) )
- Dytlewski, N. ( Australian Nuclear Science and Technology Organisation (Australia) )
- Evans, P.J. ( Australian Nuclear Science and Technology Organisation (Australia) )
- 掲載資料名:
- Nano- and Microtechnology: Materials, Processes, Packaging, and Systems
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4936
- 発行年:
- 2002
- 開始ページ:
- 403
- 終了ページ:
- 413
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447319 [0819447315]
- 言語:
- 英語
- 請求記号:
- P63600/4936
- 資料種別:
- 国際会議録
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CHARACTERIZATION AND PERFORMANCE OF CARBON FILMS DEPOSITED BY PLASMA AND ION BEAM BASED TECHNIQUES
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ION BEAM-BASED CHARACTERIZATION OF MULTICOMPONENT OXIDE THIN FILMS AND THIN FILM LAYERED STRUCTURES
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