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Characterization of the near-field profile of semiconductor lasers and the spot size of tightly focused laser beams from far-field measurements

著者名:
掲載資料名:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4932
発行年:
2003
開始ページ:
581
終了ページ:
589
総ページ数:
9
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447272 [0819447277]
言語:
英語
請求記号:
P63600/4932
資料種別:
国際会議録

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