Blank Cover Image

Characterizing CaF2 for VUV optical components: roughness, surface scatter, and bulk scatter

著者名:
掲載資料名:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4932
発行年:
2003
開始ページ:
444
終了ページ:
451
総ページ数:
8
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447272 [0819447277]
言語:
英語
請求記号:
P63600/4932
資料種別:
国際会議録

類似資料:

Hultaker, A., Gliech, S., Benkert, N., Duparre, A.

SPIE - The International Society of Optical Engineering

Flemming, M., Hultaker, A., Reihs, K., Duparre, A.

SPIE - The International Society of Optical Engineering

Hultaker, A., Gliech, S., Gessner, H., Duparre, A.

SPIE - The International Society of Optical Engineering

Gliech, S., Gessner, H., Hultaker, A., Duparre, A.

SPIE - The International Society of Optical Engineering

Gliech,S., Steinert,J., Flemming,M., Duparre,A.

SPIE-The International Society for Optical Engineering

Gliech, S., Gessner, H., Duparre, A.

SPIE-The International Society for Optical Engineering

Gliech,S., Duparre,A.

SPIE-The International Society for Optical Engineering

Duparre,A., Gliech,S.

SPIE-The International Society for Optical Engineering

Duparre,A., Gliech,S.

SPIE-The International Society for Optical Engineering

Schroder, S., Gliech, S., Duparre, A.

SPIE - The International Society of Optical Engineering

Schroder, S., Gliech, S., Duparre, A.

SPIE - The International Society of Optical Engineering

Steinert,J., Gliech,S., Wuttig,A., Duparre,A., Truckenbrodt,H.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12