Application of spectroscopic ellipsometry to characterization of optical thin films (Invited Paper)
- 著者名:
- Woollam, J.A. ( J.A. Woollam Co., Inc. (USA) )
- Bungay, C.L. ( J.A. Woollam Co., Inc. (USA) )
- Yan, L. ( Univ. of Nebraska, Lincoln (USA) )
- Thompson, D.W.
- Hilfiker, J.N. ( J.A. Woollam Co., Inc. (USA) )
- 掲載資料名:
- Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4932
- 発行年:
- 2003
- 開始ページ:
- 393
- 終了ページ:
- 404
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447272 [0819447277]
- 言語:
- 英語
- 請求記号:
- P63600/4932
- 資料種別:
- 国際会議録
類似資料:
Society of Vacuum Coaters |
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SPIE - The International Society for Optical Engineering |
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SPIE-The International Society for Optical Engineering |
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SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
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