Low-Noise High-Temperature SOI Analog Circuits

Low-Noise High-Temperature SOI Analog Circuits

著者名:

掲載資料名:

Progress in SOI structures and devices operating at extreme conditions

シリーズ名:

NATO science series. Series 2, Mathematics, physics and chemistry

シリーズ巻号:

58

発行年:

2002

開始ページ:

189

終了ページ:

210

総ページ数:

22

出版情報:

Dordrecht: Kluwer Academic Publishers

ISBN:

9781402005756 [140200575X]

言語:

英語

請求記号:

N17050/58

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012854
シリーズID:	PA00000025
会議名:	NATO advanced research workshop on progress in SOI structures and devices operating at extreme conditions
回次:	2000
会議開催地:	Kyiv, Ukraine
会議開催年:	2000.10.15-2000.10.20

類似資料:

1 国際会議録 Recent advances in SOI MOSFET devices and circuits for ultra-low power / high temperature applications Levacq, D., Dessard, V., Flandre, D. Kluwer Academic Publishers	7 国際会議録 Potential of Surface Accumulation Mode for Deep-Submicron Fully-Depleted SOI CMOS Technologies Iniguez, B., Rauly, F., Flandre, D. Electrochemical Society
2 国際会議録 Improvement of Sub-0.25 μn Fully-Depleted SOI CMOS Analog Performance by Thinning the Si Film Nave, A., Dessard, V., Delatte, P., Brodeoux, V., Iniguez, B., Rauly, E., Flandre, D. Electrochemical Society	8 国際会議録 Low-noise SOI Hall devices Haddab, Y., Mosser, V., Lysowec, M., Suski, J., Demeus, L., Renaux, C., Adriensen, S., Flandre, D. SPIE-The International Society for Optical Engineering
3 国際会議録 Modeling of the Leakage Drain Current in Accumulation-Mode SOI pMOSFETs for High-Temperature Applications Bellodi, M., Iniguez, B., Flandre, D., Martino, J.A. Electrochemical Society	9 国際会議録 Performance of Double-Gate SOI nMOSFETs at Low Temperature Vandooren, A., Cristoloveanu, S., Colinge, J.P., Flandre, D. Electrochemical Society
4 国際会議録 A Fully Analytical Continuous Model for Graded-Channel SOI MOSFET for Analog Applications Souza, M., Pavanello, M. A., Iniguez, B., Flandre, D. Electrochemical Society	10 国際会議録 Low temperature and channel engineering influence on harmonic distortion of SOI NMOSFETs for analog applications Pavanello, M.A., Cerdeira, A., Aleman, M.A., Martino, J.A., Vancaillie, L., Flandre, D. Electrochemical Society
5 国際会議録 Analog Performance of Graded-Channel SOI NMOSFETS at Low Temperatures Pavanello, M.A., Martino, J.A., Flandre, D. Electrochemical Society	11 国際会議録 Charge Injection Characterization of Thin-Film SOI MOS Transistors at High Temperature Picun, G., Demeus, L., Flandre, D. Electrochemical Society
6 国際会議録 Radiation effect on electrical properties of fully-depleted UNIBOND SOI MOSFETs Houk, Y., Nazarov, A. N., Turchanikov, V. I., Lysenko, V. S., Adriaensen, S., Flandre, D. Kluwer Academic Publishers	12 国際会議録 Nature of high-temperature charge instability of fully depleted SOI MOSFETs Nazarov, A.N., Lysenko, V.S., Colinge, J.P., Flandre, D. Electrochemical Society

1

2

3

4

5

6

7

8

9

10

11

12