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Effect of Gate Profile on the Characteristics of 0.5μm GaAs MESFETs

著者名:
Naik, A.A.
Rawal, D.S.
Prabhakar, S.
Sai Saravanan, G.
Sehgal, B.K.
Gulati, R.
Vyas, H.P.
Kumar, Rajesh
Suryanarayana, P.
Rao, A.V.S.K.
Govindacharyulu, P.A.
さらに 6 件
掲載資料名:
Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001)
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4746
発行年:
2002
巻:
VOL-2
開始ページ:
1148
終了ページ:
1151
総ページ数:
4
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445001 [0819445002]
言語:
英語
請求記号:
P63600/4746
資料種別:
国際会議録

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