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Effect of Ion- Beam Milling on Lips Prior to Lift-Off Process

著者名:
Bhan, R.K.
Mittal, V.
Rawal, D.S.
Naik, A.A.
Sehgal, B.K.
Singh, K.P.
Singh, B.V.
Aneja, B.R.
Sharma, B.L.
Singh, R.
Gopal, V.
さらに 6 件
掲載資料名:
Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001)
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4746
発行年:
2002
巻:
VOL-2
開始ページ:
1049
終了ページ:
1052
総ページ数:
4
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819445001 [0819445002]
言語:
英語
請求記号:
P63600/4746
資料種別:
国際会議録

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