Incipient damage localization with smart piezoelectric transducers using high-frequency actuation

Incipient damage localization with smart piezoelectric transducers using high-frequency actuation

著者名:

Naidu, A.S.K. ( Nanyang Technological Univ. (Singapore) )
Bhalla, S.
Soh, C.K.

掲載資料名:

Smart structures, devices, and systems : 16-18 December 2002 Melbourne, Australia

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4935

発行年:

2002

開始ページ:

473

終了ページ:

483

総ページ数:

11

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447302 [0819447307]

言語:

英語

請求記号:

P63600/4935

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012783
シリーズID:	PA00000029
会議名:	Smart Materials, Nano-, and Micro- Smart Systems : Smart Structures, Devices, and Systems
回次:	2002
会議開催地:	Melbourne, Australia
会議開催年:	2002.12.16-2002.12.18

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