Optimum scaling theory to minimize the roll-off of threshold voltage for nanoscale MOSFET

Optimum scaling theory to minimize the roll-off of threshold voltage for nanoscale MOSFET

著者名:

Lim, G.-S. ( Kunsan National Univ. (South Korea) )
Ko, S.-W.
Kim, J.-H.
Lee, J.-I.
Jung, H.-K.

掲載資料名:

Smart structures, devices, and systems : 16-18 December 2002 Melbourne, Australia

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4935

発行年:

2002

開始ページ:

325

終了ページ:

332

総ページ数:

8

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447302 [0819447307]

言語:

英語

請求記号:

P63600/4935

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012783
シリーズID:	PA00000029
会議名:	Smart Materials, Nano-, and Micro- Smart Systems : Smart Structures, Devices, and Systems
回次:	2002
会議開催地:	Melbourne, Australia
会議開催年:	2002.12.16-2002.12.18

類似資料:

1 国際会議録 Comparison of LDD and double-gate MOSFET for nanoscale devices Ko, S.-W., Kim, J.-H., Jung, H.-K. SPIE-The International Society for Optical Engineering	7 国際会議録 Minimization of DUV multi-interference effect in 0.25-ｦﾌm device fabrication Kim,J.H., Moon,S.C., Ko,B.S., Park,J.H., Lee,T.G., Shin,K.S., Kim,D.H. SPIE-The International Society for Optical Engineering
2 国際会議録 Optimization of side gate length and side gate voltage for sub-100-nm double-gate MOSFET Kim, J.-H., Kim, G.-H., Ko, S.-W., Jung, H.-K. SPIE-The International Society for Optical Engineering	8 国際会議録 The Influence of Rolling Parameters on Microstructure and Mechanical Properties of the As-Rolled AZ31 Magnesium Alloy Sheet H.G. Jeong, J.B. Lee, W.J. Kim, S.J. Lim, S. Choi Trans Tech Publications
3 国際会議録 Highly Suppressed Threshold Voltage Roll-off Characteristics of the 4 nm-Thick SOI n- MOSFETs in the 40-135 nm Gate Length Regime Suzuki, E, Ishii, K, Kanemaru, S, Maeda, T, Tautaumi, T, Nagai, K, Sekigawa, T, Hiroshima, H Electrochemical Society	9 国際会議録 Optimum Design of a Pilger Mill Process for Wire Forming Using CAD/CAE Park, H. J., Kim, S. S., Lee, S., Choi, T. H., Lee, H. W., Lim, S. J., Kim, E. Z., Na, K. H., Han, C. S. Trans Tech Publications
4 国際会議録 Relationship between C-Face Defects and Threshold-Voltage Instability in C-Face 4H-SiC MOSFETs Studied by Electrically Detected Magnetic Resonance G.W. Kim, R. Arai, S.J. Ma, M. Okamoto, H. Yoshioka Trans Tech Publications	10 国際会議録 Optimization of material and process parameter for minimizing defect in implementation of MFHM process K. Lee, J. Heo, K. Ban, H. Seo, G. Lee, W. Kim, J. Cho, J. Sun, S. Lee, C. Bok, S. Moon, J. Kim SPIE - The International Society of Optical Engineering
5 国際会議録 Study for high voltage gate RIE process in LOI (LCD driver IC) device fabrication M. G. Lee, C. K. Jung, S. W. Ryu, K. H. Lee, J. W. Han Society of Photo-optical Instrumentation Engineers	11 国際会議録 Effect of SiGe Layer on Electrical Characteristics of SGI-PDSOI MOSFETs Choc, T.H., Bac, G.J., Kim, S.S., Rhee, H.S., Lee, K.W., Lee, N.I., Kang, H.S., Fujihara, K., Kang, H.K., Moon, J.T. Electrochemical Society
6 国際会議録 Fabrication and characterization of InGaN Nano-scale dots for blue and green LED applications Kim, K. S., Hong, C-H., Lee, W-H., Kim, C. S., Cha, O. H., Yang, G. M., Suh, E-K., Lim, K. Y., Lee, H. J., Cho, H. K., … MRS-Materials Research Society	12 国際会議録 Development of the micro-CT system for small animal [5923-31] Nam, K. Y., Lim, J. H., Jung, Y. J., Kim. K. W., Park, J. G., Yoon, K. H. SPIE - The International Society of Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12