Monitoring the influence of environmental conditions on the growth of plants using statistical interferometry
- 著者名:
- Kadono, H. ( Saitama Univ. (Japan) )
- Nakamura, T.
- Matsui, K.
- Toyooka, S.
- 掲載資料名:
- Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 4933
- 発行年:
- 2003
- 開始ページ:
- 355
- 終了ページ:
- 359
- 総ページ数:
- 5
- 出版情報:
- Bellingham, Wash: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819447289 [0819447285]
- 言語:
- 英語
- 請求記号:
- P63600/4933
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Statistical interferometry and application to monitoring of biological activity of plants [6341-45]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
9
国際会議録
Generation of contrast-enhanced speckle field and its application to surface roughness measurement
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |