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Detection of faults in interferometric fringe patterns by optical wavelet filtering

著者名:
掲載資料名:
Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4933
発行年:
2003
開始ページ:
218
終了ページ:
225
総ページ数:
8
出版情報:
Bellingham, Wash: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447289 [0819447285]
言語:
英語
請求記号:
P63600/4933
資料種別:
国際会議録

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