Phase singularities in dynamic speckle fields and their applications to optical metrology

Phase singularities in dynamic speckle fields and their applications to optical metrology

著者名:

Wang, W. ( Univ. of Electro-Communications (Japan) )
Ishii, N.
Miyamoto, Y.
Takeda, M.

掲載資料名:

Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4933

発行年:

2003

開始ページ:

175

終了ページ:

180

総ページ数:

6

出版情報:

Bellingham, Wash: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447289 [0819447285]

言語:

英語

請求記号:

P63600/4933

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012782
シリーズID:	PA00000029
会議名:	Speckle Metrology
回次:	2003
会議開催地:	Trondheim, Norway
会議開催年:	2003.06.18-2003.06.20

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