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Nanoscale spatially resolved simultaneous measurement of in-plane and out-of-plane force components on surfaces: a novel operational mode in atomic force microscopy

著者名:
掲載資料名:
Smart materials II : 16-18 December 2002, Melbourne, Australia
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4934
発行年:
2002
開始ページ:
386
終了ページ:
398
総ページ数:
13
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447296 [0819447293]
言語:
英語
請求記号:
P63600/4934
資料種別:
国際会議録

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