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Radial shearing interferometer for aspheric surface testing

著者名:
掲載資料名:
Optical design and testing : 15-18 October 2002, Shanghai, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4927
発行年:
2002
開始ページ:
673
終了ページ:
676
総ページ数:
4
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447166 [0819447161]
言語:
英語
請求記号:
P63600/4927
資料種別:
国際会議録

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