Self-referenced Hartmann testing: radical slope testing

Self-referenced Hartmann testing: radical slope testing

著者名:

Su, P. ( Beijing Institute of Technology (China) )
Yu, Y.
Zhu, Q.D.
Cao, G.

掲載資料名:

Adaptive optics and and applications II : 15-16 October 2002 Shanghai, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4926

発行年:

2002

開始ページ:

140

終了ページ:

145

総ページ数:

6

出版情報:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819447159 [0819447153]

言語:

英語

請求記号:

P63600/4926

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012775
シリーズID:	PA00000029
会議名:	Photonics Asia : Adaptive Optics and Applications
回次:	2002 : 2nd
会議開催地:	Shanghai, China
会議開催年:	2002.10.15-2002.10.16

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