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Improvement and application of scanning near-field optical microscope based on a piezoelectric bimorph shear force beam

著者名:
Chen, T. ( Tsinghua Univ. (China) )
Shi, S.
Sun, J.L.
Tan, X.J.
Tian, G.Y.
Cao, Y.
Guo, J.H.
さらに 2 件
掲載資料名:
Nano-Optics and Nano-Structures
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4923
発行年:
2002
開始ページ:
31
終了ページ:
35
総ページ数:
5
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447128 [0819447129]
言語:
英語
請求記号:
P63600/4923
資料種別:
国際会議録

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