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Probe design for measuring high-reflective surface

著者名:
掲載資料名:
Advanced sensor systems and applications : 15-18 October 2002, SHanghai, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4920
発行年:
2002
開始ページ:
433
終了ページ:
436
総ページ数:
4
出版情報:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447098 [0819447099]
言語:
英語
請求記号:
P63600/4920
資料種別:
国際会議録

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