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Measurement of dew droplets in initial deposition at dew point by using a phase-shift interference microscope

著者名:
掲載資料名:
Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4919
発行年:
2002
開始ページ:
195
終了ページ:
203
総ページ数:
9
出版情報:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819447081 [0819447080]
言語:
英語
請求記号:
P63600/4919
資料種別:
国際会議録

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