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Progress with the implementation of a shearography system for the testing of technical components

著者名:
掲載資料名:
Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
4900
発行年:
2002
巻:
Part Two
開始ページ:
1299
終了ページ:
1309
総ページ数:
11
出版情報:
SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819446862 [0819446866]
言語:
英語
請求記号:
P63600/4900
資料種別:
国際会議録

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