Using new WaveShrink technique and edge information to reduce the SAR speckle

Using new WaveShrink technique and edge information to reduce the SAR speckle

著者名:

Luo, W. ( Univ. of Electronic Science and Technology of China (China) )
Yang, J.
Pi, Y.
Huang, S.

掲載資料名:

Image processing and pattern recognition in remote sensing :25-27 October 2002, Hangzhou, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4898

発行年:

2003

開始ページ:

295

終了ページ:

302

総ページ数:

8

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446848 [081944684X]

言語:

英語

請求記号:

P63600/4898

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012747
シリーズID:	PA00000029
会議名:	Asia-Pacific Environmental Remote Sensing : Image processing and pattern recognition in remote sensing
回次:	2002
会議開催地:	Hangzhou, China
会議開催年:	2002.10.25-2002.10.27

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