Line feature extraction and matching in palmprint

Line feature extraction and matching in palmprint

著者名:

Wu, X.Q. ( Harbin Institute of Technology (China) )
Wang, K.Q.
Zhang, D. ( Hong Kong Polytechnic Univ. )

掲載資料名:

Second International Conference on Image and Graphics

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4875

発行年:

2002

巻:

Part One

開始ページ:

583

終了ページ:

590

総ページ数:

8

出版情報:

Bellingham, WA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446565 [0819446564]

言語:

英語

請求記号:

P63600/4875

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012720
シリーズID:	PA00000029
会議名:	International Conference on Image and Graphics
回次:	2002 : 2nd
会議開催地:	Hefei, China
会議開催年:	2002.08.16-2002.08.18

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