Optimized design and simulation of electrical capacitance sensor for electrical capacitance tomography system

Optimized design and simulation of electrical capacitance sensor for electrical capacitance tomography system

著者名:

Chen, D. Y. ( Harbin Univ. of Science and Technology (China) )
Zheng, G. B.
Yang, C. J.
Yu, X. Y.

掲載資料名:

Java/Jini Technologies and High-Performance Pervasive Computing

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4863

発行年:

2002

開始ページ:

138

終了ページ:

142

総ページ数:

5

出版情報:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446428 [0819446424]

言語:

英語

請求記号:

P63600/4863

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012708
シリーズID:	PA00000029
会議名:	Convergence of IT and Communications : Java/Jini Technologies and High-Performance Pervasive Computing
回次:	2002
会議開催地:	Boston, MA, USA
会議開催年:	2002.07.30-2002.08.01

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