Space Interferometry Mission starlight and metrology subsystems

Space Interferometry Mission starlight and metrology subsystems

著者名:

Ames, L.L. ( Lockheed Martin Space Systems Co.(USA) )

Oseas, J.M. ( Jet Propulsion Lab.(USA) )

Pryor, M. ( Lockheed Martin Space Systems Co.(USA) )

Schaechter, D.B.

Stubbs, D.M.

さらに 4 件

掲載資料名:

Interferometry in Space

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4852

発行年:

2003

巻:

Part One

開始ページ:

289

終了ページ:

301

総ページ数:

13

出版情報:

Bellingham, WA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446312 [0819446319]

言語:

英語

請求記号:

P63600/4852

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012696
シリーズID:	PA00000029
会議名:	Astronomical Telescopes and Instrumentation : Interferometry in Space
回次:	2002
会議開催地:	Waikoloa, Hawaii, USA
会議開催年:	2002.08.26-2008.08.28

類似資料:

1 国際会議録 Compact and stable dual-fiber-optic refracting collimator Stubbs, D.M., Smith, E., Dries, L., Kvamme, T., Barrett, S. SPIE-The International Society for Optical Engineering	7 テクニカルペーパー Development of a Deployable Nonmetallic Boom for Reconfigurable Systems of Small Spacecraft F. Rehnmark, M. Pryor, B. Holmes, D. Schaechter, N. Pedreiro, C. Carrington American Institute of Aeronautics and Astronautics
2 国際会議録 SIM external metrology beam launcher(QP) development Ames, L.L., Barrett, R., Bell, R.M., Jr., Dries, L.J., Dutta, K., Halverson, P.G., Holmes, B., Kvamme, E.T., Leary, … SPIE-The International Society for Optical Engineering	8 国際会議録 Rapid at-wavelength inspection of FUV mask blanks by photoresist transfer Spector,S.J., White,D.L., Tennant,D.M., Luo,P., ll,O.R.Wood SPIE - The International Society for Optical Engineering
3 国際会議録 Wide-field imaging interferometry testbed 3: metrology subsystem Leviton, D.B., Frey, B.J., Leisawitz, D.T., Martino, A.J., Maynard, W.L., Mundy, L.G., Rinehart, S.A., Teng, S.H., … SPIE-The International Society for Optical Engineering	9 国際会議録 Multiple-aperture telescope array with a high fill factor Duncan, A.L., Sigler, R.D., Stubbs, D.M. SPIE-The International Society for Optical Engineering
4 国際会議録 Absolute metrology for the Kite testbed Mason, J.E. SPIE-The International Society for Optical Engineering	10 テクニカルペーパー Optical Diagnostics Development for the Ames Arcjet Facilities. Grinstead, J.H., Driver, D.M., Raiche, G.A. American Institute of Aeronautics and Astronautics
5 国際会議録 Sensitivity of optical metrology calibration to measured corner cube retroreflector parameters for the Space Interferometry Mission Kuan, G.M., Moser, S.J. SPIE-The International Society for Optical Engineering	11 国際会議録 Quantitative characterization of optical polishing pitch DeGroote,J.E., Jacobs,S.D., Gregg,L.L., Marino,A.E., Hayes,J.C. SPIE-The International Society for Optical Engineering
6 国際会議録 Integration of KLA Starlight for phase-shift mask manufacturing Rigaill,D.M. SPIE-The International Society for Optical Engineering	12 国際会議録 PREVAIL-EPL alpha tool electron optics subsystem Pfeiffer,H.C., Dhaliwal,R.S., Golladay,S.D., Doran,S.K., Gordon,M.S., Kandall,R.A., Lieberman,J.E., Pinckney,D.J., … SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12