Sub-arcsecond differential deflectometry to measure thermally induced distortions of the Swift optical bench

Sub-arcsecond differential deflectometry to measure thermally induced distortions of the Swift optical bench

著者名:

Leviton, D.B. ( NASA Goddard Space Flight Ctr.(USA) )
Frey, B.J.
Madison, L.E.
Parker, J.A.
Sheinman, O.E.

掲載資料名:

X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

4851

発行年:

2003

巻:

Part One

開始ページ:

587

終了ページ:

598

総ページ数:

12

出版情報:

Bellingham WA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819446305 [0819446300]

言語:

英語

請求記号:

P63600/4851

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00012694
シリーズID:	PA00000029
会議名:	Astronomical Telescopes and Instrumentation : X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy
回次:	2002
会議開催地:	Waikoloa, Hawaii, USA
会議開催年:	2002.08.24-2008.08.28

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